Pico- and Kiloampere Measurements of Power Semiconductors in Milliseconds: Facing Parasitics in High Power Semiconductor Testing

In his presentation, B.Eng. Alexander Loibl provides an overview of the challenges in high power semiconductor testing and introduces the audience to VXI 6-Wire technology. This technology enables insulation levels of up to 1,000 tera-ohms and allows so the combination of low path resistance and extremely high insulation resistance in one fixture. At the same time, the VXI 6-Wire technology improves settling behavior, and reducing so significantly the test times. This helps companies to perform cost-efficient – and thus fast – as well as precise measurements.