Hidden Hardware and Software Layers Impacting your Cost of Test and System Reliability

Over time, test systems have evolved from simple analog voltage measurement instruments into sophisticated and complex machines. While expectation is that decades of research & development in this space would result in highly polished systems, the reality is far from ideal.

In this presentation, we will explain what a measurement system consists of, identify its main components, and describe how it affects system reliability and measurement speed. We aim to demonstrate how a standardized approach can be used to create and scale test solutions using PXI systems. We will explore both software and hardware aspects of the problem and discuss potential hybrid solutions.